TESCAN is one of the world leaders in the design, manufacture and distribution of scanning electron microscopes and scanning electron microscopy workstations combined with focused ion beam and provides authorized service, application specialists and own microscope demonstration laboratories.

Scanning electron microscopes SEM, FE-SEM and FIB-SEM and Multimodal holographic microscope.

Applications: Materials Science, Life Sciences, Earth Sciences, Semiconductors.

Local contact:

Pedro Vardanega

Contact supplier:

Rafael Soldatelli Rossetto


They allow to analyze sample surfaces in the nanoscale range. They include models of thermionic emission (tungsten filament) and field emission (Shottky). Different levels of resolution. Different sizes of sample cameras and a variety of detectors available.


They include, in addition to the electron column, an ion column (focused ion beam) that produces the grinding of the sample, thus allowing different layers of the sample to be analyzed. The different models available allow to obtain different levels of resolution, have cameras for sample of different sizes, wide availability of detectors, including Mass Spectrometers conintegration to the FIB-SEM models.


For Quantitative Phase Image (QPI).


Av. Boedo 1813 C1239AAI, C.A.B.A., Argentina phone +54 11 4909-2600